Optical beam induced current investigations of particle detectors

被引：0

作者：

Castaldini, A

Cavallini, A

Polenta, L

机构：

[1] INFM, I-40127 Bologna, Italy

[2] Univ Bologna, Dept Phys, I-40127 Bologna, Italy

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 2000年 / 222卷 / 01期

关键词：

D O I：

10.1002/1521-3951(200011)222:1<245::AID-PSSB245>3.0.CO;2-Y

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

OBIC analyses of particle detectors are presented. The depletion layer width W of semi-insulating gallium arsenide Schottky detectors versus biasing has been studied and it is concluded that at high voltages W linearly increases with the applied bias. Furthermore, the electric field distribution in silicon p-i-n detectors has been investigated before and after heavy irradiation and a V-shaped distribution has been assessed.

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页码：245 / 250

页数：6

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