N-face GaN(000(1)over-bar) films grown by group-III-source flow-rate modulation epitaxy

被引:4
|
作者
Lin, Chia-Hung [1 ]
Akasaka, Tetsuya [1 ]
Yamamoto, Hideki [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
关键词
C-PLANE SAPPHIRE; MIGRATION-ENHANCED EPITAXY; LIGHT-EMITTING-DIODES; GAN; GAAS; LAYER; HETEROSTRUCTURES; POLAR; MODE; ALN;
D O I
10.7567/JJAP.53.11RC01
中图分类号
O59 [应用物理学];
学科分类号
摘要
N-face GaN(000 (1) over bar) films were grown on sapphire substrates with a very small misorientation angle (0.15 degrees) by flow-rate modulation epitaxy (FME). We investigated two types of FME: FME in which Ga precursor with flow rate of 2.08 x 10(-5) mol/min is intermittently supplied (intermittent supply of group-III-source FME) and in which Ga precursors with flow rates of 2.08 x 10(-5) and 1.04 x 10(-5) mol/min are alternately supplied (group-IIIsource FME). Etching of GaN films is effectively suppressed in group-III-source FME, while the etching significantly impedes the growth rate in intermittent supply of group-III-source FME. Group-III-source FME promotes surface migration of Ga adatoms, thus terminating the formation of hillocks on N-face GaN(000 (1) over bar) surfaces. (C) 2014 The Japan Society of Applied Physics
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页数:4
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