Defect engineering in rare-earth-doped BaTiO3 ceramics: Route to high-temperature stability of colossal permittivity

被引:43
作者
Meng, Yingzhi [1 ]
Liu, Kang [1 ]
Zhang, Xiuyun [1 ]
Lei, Xiuyun [1 ]
Chen, Jun [2 ,3 ]
Yang, Zhao [3 ]
Peng, Biaolin [4 ]
Long, Changbai [4 ]
Liu, Laijun [1 ]
Li, Chunchun [1 ]
机构
[1] Guilin Univ Technol, Coll Mat Sci & Engn, Guangxi Key Lab Opt & Elect Funct Mat & Devices, Key Lab Nonferrous Mat & New Proc Technol,Minist, Guilin 541004, Peoples R China
[2] Univ Sci & Technol Beijing, Beijing Adv Innovat Ctr Mat Genome Engn & Dept Ph, Beijing, Peoples R China
[3] Guangdong Fenghua Adv Technol Holding Co Ltd, State Key Lab Adv Mat & Elect Components, Zhaoqing, Peoples R China
[4] Xidian Univ, Sch Adv Mat & Nanotechnol, Xian, Peoples R China
关键词
ceramics; colossal permittivity; defect dipole; low loss; rare earth; HIGH INSULATION RESISTIVITY; GIANT DIELECTRIC-PROPERTIES; CACU3TI4O12; CHEMISTRY; TITANIUM; POLARIZATION; RELAXATION; TITANATE; BEHAVIOR; LA;
D O I
10.1111/jace.18512
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
High-performance colossal-permittivity (CP) materials have huge potential applications in the miniaturization of electronic components and high-energy storage applications. Here, we report CP behavior in rare-earth Ln-doped BaTiO3 (Ln = La, Ce, Pr, Nd, Sm, Gd, Dy, Ho, and Er) ceramics. CP (>1 x 10(5)) and low loss (<5% at 1 kHz) were achieved. Additionally, all ceramic samples with excellent temperature stability over a wide temperature range (25-250 degrees C). X-ray photoelectron spectroscopy verified the existence of point defects (Ti3+ and VO center dot center dot$V_{\rm{O}}<^>{{\rm{ \bullet \bullet }}}$) in Ln-doped BaTiO3 ceramic samples annealed in an N-2 atmosphere. Electron paramagnetic resonance further demonstrated the existence of Ti3+. The coupling of point defects forms an electron-pinned defect-dipoles (EPDD) effect and induces strong hopping polarization. In addition, an internal barrier layer capacitance (IBLC) effect and a surface barrier layer capacitor (SBLC) effect are identified by impedance spectroscopy and DC bias voltage. The CP is attributed to the combined effect of EPDD, IBLC, and SBLC. Furthermore, the high-temperature stability of CP is related to the strong coupling of defect-dipole complexes.
引用
收藏
页码:5725 / 5737
页数:13
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