Multipoint diffraction strain sensor with variable sensitivity

被引：9

作者：

Wang, Jun ^{[1
]}

Asundi, Anand K. ^{[1
]}

Zhou, Wei ^{[1
]}

Lim, Lennie E. N. ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore

来源：

APPLIED OPTICS | 2007年 / 46卷 / 11期

关键词：

D O I：

10.1364/AO.46.002041

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In our earlier work, a multipoint diffaction strain sensor using a microlens array was developed for measurement of whole-field strains. The method is extended to a system with variable sensitivity and measurement range. In the present system, two collimated laser beams, 3 mm in diameter, symmetrically strike the grating attached to the specimen surface at prescribed angles. The diffracted wavefronts, magnified by a microscope objective, are sampled by a lenslet array with each microlens acting as an individual strain sensor. In-plane strain components over the full field can be measured by what is to our knowledge a new sensor with variable sensitivity by changing the distance from the microscope objective to the microlens array. Both a theoretical explanation and experimental verification are provided. (c) 2007 Optical Society of America.

引用

页码：2041 / 2048

页数：8

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