Study on atomic density changes in the liquid Al-Si alloys by X-ray diffraction method

被引：12

作者：

Wang, WM ^{[1
]}

Bian, XF

Qin, JY

Fan, TG

机构：

[1] Shandong Univ Technol, Coll Mat Sci & Technol, Jinan 250061, Peoples R China

[2] Shanghai Jiao Tong Univ, State Key Lab Met Matrix Composites, Shanghai 200030, Peoples R China

来源：

JOURNAL OF MATERIALS SCIENCE LETTERS | 2000年 / 19卷 / 17期

关键词：

D O I：

10.1023/A:1006741626728

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A pure Al melt, an Al matrix with Al2O3 particles and Al-Si alloys were examined at various temperatures using a θ-θ high-temperature X-ray diffractometer. The atomic distances and densities of the melt were calculated from the diffraction data. The atomic density of pure liquid Al and the Al matrix were found to decrease, while the amount of free volume they contained increased, with increasing temperature.

引用

页码：1583 / 1585

页数：3

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