Features of the Calibration of Optical Power Meters

被引：0

作者：

Velychko, Oleh ^{[1
]}

Gaman, Valentyn ^{[1
]}

Kursin, Sergii ^{[1
]}

机构：

[1] Sci & Prod Inst Electromagnet Measurements State, Kiev, Ukraine

来源：

2022 XXXII INTERNATIONAL SCIENTIFIC SYMPOSIUM METROLOGY AND METROLOGY ASSURANCE (MMA) | 2022年

关键词：

measuring instruments; optical power; calibration; standard; measurement uncertainty; sensor; NIST;

D O I：

10.1109/MMA55579.2022.9992606

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Fiber-optic technologies and fiber-optic communication lines have gained widespread popularity in the construction of global networks and data transmission systems. Optic power meter (OPM) is used for optical power measurements of the signals, determine the attenuation at the operating wavelength complete with the source of optical radiation. The allowed research to determine the calibration scheme of OPMs both by the method of direct comparison with the standard. The proposed methodology for estimating the uncertainty of optic power measurements can be used when calibrating OPMs at a wavelengths of 1310 nm and 1550 nm. It takes into account and allows to determine the most significant components of the total standard uncertainty of measurements of the optic power and to receive result of the corresponding calibration.

引用

页码：77 / 80

页数：4

共 14 条

[1]

[Anonymous], 1995, JCGM 100

[2]

[Anonymous], 2011, GR198CORE TELC TECHN

[3]

[Anonymous], EA0402

[4]

[Anonymous], 613152019 IEC

[5]

C, 2017, RGM322017 COOMET

[6] Domain-engineered pyroelectric radiometer [J].

Lehman, J ;

Eppeldauer, G ;

Aust, JA ;

Racz, M .

APPLIED OPTICS, 1999, 38 (34) :7047-7055

[7]

Livigni D J, 2003, NIST SPECIAL PUBLICA, V250-62, P144

[8]

Nel M., 2009, TEST MEASUREMENT C 2

[9] Measuring very low optical powers with a common camera [J].

Popescu, Silviu T. ;

Gheorghe, Petronela S. ;

Petris, Adrian .

APPLIED OPTICS, 2014, 53 (24) :5460-5464

[10] Comparison of optical-power meters between the NIST and the PTB [J].

Vayshenker, I ;

Haars, H ;

Li, X ;

Lehman, JH ;

Livigni, DJ .

METROLOGIA, 2000, 37 (04) :349-350

← 1 2 →