Reliability assessment process for complex electronic systems

被引：0
|
作者：
Kras, A.
Mrak, Z.
机构：
来源：
Annals of DAAAM for 2005 & Proceedings of the 16th International DAAAM Symposium: INTELLIGENT MANUFACTURING & AUTOMATION: FOCUS ON YOUNG RESEARCHES AND SCIENTISTS | 2005年
关键词：
reliability; durability; failure rate;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper describes reliability assessment process for complex electronic systems. It contains information on why reliability is required and how and where the results of the assessment are used. Two types of assessment are discussed: the similarity analysis and durability analysis. The procedure outlined is aimed at providing reliability analysts, project managers, risk managers, designers, safety and reliability engineers and logistic support engineers with a process for estimating the system's instantaneous failure rate.
引用
收藏
页码：209 / 210
页数：2
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