New Permittivity Measurement Methods Using Resonant Phenomena For High-Permittivity Materials

This paper describes the characterization of high-permittivity materials with a dielectric constant (epsilon(r)) up to 3000 using resonant phenomena. We propose and demonstrate two types of measurement techniques: the rectangular resonator method by controlling the sample insertion length and the waveguide reflection method with a sample terminated by a short circuit. We investigate the validity and the range of application of both methods by performing numerical calculations. We also experimentally demonstrate these two methods by measuring dielectric materials with epsilon(r) similar to 100 and 200 for the former method and those with epsilon(r) similar to 200, 1400, 1700, and 2900 for the latter method. By estimating the measurement uncertainty using Monte Carlo calculations, we clarify that the results obtained by both methods for a dielectric material with epsilon(r) similar to 200 are almost consistent within the ranges of the uncertainties.