Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory

被引：36

作者：

Mantouvalou, I. ^{[1
]}

Witte, K. ^{[1
]}

Martyanov, W. ^{[1
]}

Jonas, A. ^{[1
]}

Groetzsch, D. ^{[1
]}

Streeck, C. ^{[2
]}

Loechel, H. ^{[3
]}

Rudolph, I. ^{[3
]}

Erko, A. ^{[3
]}

Stiel, H. ^{[4
]}

Kanngiesser, B. ^{[1
]}

机构：

[1] Tech Univ Berlin, Inst Opt & Atom Phys, D-10623 Berlin, Germany

[2] Phys Tech Bundesanstalt, D-10587 Berlin, Germany

[3] Helmholtz Zentrum Berlin, D-14109 Berlin, Germany

[4] Max Born Inst Nonlinear Opt & Short Pulse Spect, D-12489 Berlin, Germany

来源：

APPLIED PHYSICS LETTERS | 2016年 / 108卷 / 20期

关键词：

REFLECTION; MONOCHROMATOR; RADIATION; PULSES; BERLIN; PTB;

D O I：

10.1063/1.4951000

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

With the help of adapted off-axis reflection zone plates, near edge X-ray absorption fine structure spectra at the C and N K-absorption edge have been recorded using a single 1.2 ns long soft X-ray pulse. The transmission experiments were performed with a laser-produced plasma source in the laboratory rendering time resolved measurements feasible independent on large scale facilities. A resolving power of E/Delta E similar to 950 at the respective edges could be demonstrated. A comparison of single shot spectra with those collected with longer measuring time proves that all features of the used reference samples (silicon nitrate and polyimide) can be resolved in 1.2 ns. Hence, investigations of radiation sensitive biological specimen become possible due to the high efficiency of the optical elements enabling low dose experiments. Published by AIP Publishing.

引用

页数：4

共 22 条

[21] Off-axis reflection zone plate for quantitative soft x-ray source characterization [J].