Robust Discriminative Metric Learning for Image Representation

被引:22
作者
Ding, Zhengming [1 ]
Shao, Ming [2 ]
Hwang, Wonjun [3 ]
Suh, Sungjoov [4 ]
Han, Jae-Joon [4 ]
Choi, Changkyu [4 ]
Fu, Yun [5 ]
机构
[1] Indiana Univ Purdue Univ, Dept Comp Informat & Technol, Indianapolis, IN 46202 USA
[2] Univ Massachusetts Dartmouth, Comp & Informat Sci, N Dartmouth, MA 02747 USA
[3] Ajou Univ, Dept Software & Comp Engn, Coll Informat Technol, Suwon 16499, South Korea
[4] Samsung Adv Inst Technol, Software Solut Lab, Suwon 446712, South Korea
[5] Northeastern Univ, Coll Comp & Informat Sci, Dept Elect & Comp Engn, Boston, MA 02115 USA
关键词
Measurement; Data models; Noise reduction; Optimization; Face recognition; Feature extraction; Machine learning algorithms; Robust metric learning; fast low-rank representation; CONQUER METHOD; FACE; RECOGNITION;
D O I
10.1109/TCSVT.2018.2879626
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Metric learning has attracted significant attention in the past decades, because of its appealing advances in various real-world tasks, e.g., person re-identification and face recognition. Traditional supervised metric learning attempts to seek a discriminative metric, which could minimize the pairwise distance of within-class data samples, while maximizing the pairwise distance of data samples from various classes. However, it is still a challenge to build a robust and discriminative metric, especially for corrupted data in the real-world application. In this paper, we propose a Robust Discriminative Metric Learning algorithm through fast low-rank representation and denoising strategy. To be specific, the metric learning problem is guided by a discriminative regularization by incorporating the pair-wise or class-wise information. Moreover, the low-rank basis learning is jointly optimized with the metric to better uncover the global data structure and remove noise. Furthermore, the fast low-rank representation is implemented to mitigate the computational burden and ensure the scalability on large-scale datasets. Finally, we evaluate our learned metric on several challenging tasks, e.g., face recognition/verification, object recognition, image clustering, and person re-identification. The experimental results verify the effectiveness of our proposed algorithm in comparison to many metric learning algorithms, even deep learning ones.
引用
收藏
页码:3173 / 3183
页数:11
相关论文
共 53 条
[1]   Face description with local binary patterns:: Application to face recognition [J].
Ahonen, Timo ;
Hadid, Abdenour ;
Pietikainen, Matti .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2006, 28 (12) :2037-2041
[2]  
[Anonymous], PROC CVPR IEEE
[3]   Eigenfaces vs. Fisherfaces: Recognition using class specific linear projection [J].
Belhumeur, PN ;
Hespanha, JP ;
Kriegman, DJ .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1997, 19 (07) :711-720
[4]  
Bellet A., 2013, SURVEY METRIC LEARNI
[5]  
Bromley J., 1993, International Journal of Pattern Recognition and Artificial Intelligence, V7, P669, DOI 10.1142/S0218001493000339
[6]   Similarity Metric Learning for Face Recognition [J].
Cao, Qiong ;
Ying, Yiming ;
Li, Peng .
2013 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV), 2013, :2408-2415
[7]  
Chen Minmin, 2012, MARGINALIZED DENOISI
[8]   When Deep Learning Meets Metric Learning: Remote Sensing Image Scene Classification via Learning Discriminative CNNs [J].
Cheng, Gong ;
Yang, Ceyuan ;
Yao, Xiwen ;
Guo, Lei ;
Han, Junwei .
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 2018, 56 (05) :2811-2821
[9]   Duplex Metric Learning for Image Set Classification [J].
Cheng, Gong ;
Zhou, Peicheng ;
Han, Junwei .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2018, 27 (01) :281-292
[10]  
Davis J. V., 2007, P 24 INT C MACH LEAR, P209, DOI DOI 10.1145/1273496.1273523