Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode

被引：21

作者：

Hylsky, Josef ^{[1
]}

Strachala, David ^{[1
]}

Vyroubal, Petr ^{[1
]}

Cudek, Pavel ^{[1
]}

Vanek, Jiri ^{[1
]}

Vanysek, Petr ^{[1
]}

机构：

[1] Fac Elect Engn & Commun, Dept Elect & Elect Technol, Tech 10, Brno 61600, Czech Republic

来源：

MICROELECTRONICS RELIABILITY | 2018年 / 85卷

关键词：

Potential induced degradation; Negative voltage potential; Photovoltaic power plant; SolidWorks simulation; Photovoltaic modules; SILICON SOLAR-CELLS; STACKING-FAULTS; DEFECTS; MODULES;

D O I：

10.1016/j.microrel.2018.04.003

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper deals with Potential Induced Degradation (PID) of p-type monocrystalline PV modules (Evergreen) from a photovoltaic power plant that has been in operation mode for 7 years. Within the PV module affected by the PID degradation, the effect of the electric field on individual PV cells is studied. The distribution of the electric field was simulated by SolidWorks software. The results show a random distribution of affected PV cells not related to the size and distribution of the electric field intensity. Furthermore, the dependencies of negative voltage potential on the range of PID degradation of individual PV modules located in the negative pole of the PV string is made. From measured current voltage characteristics (measured at STC), it is evident that the value of negative voltage potential is not directly proportional to the PID occurrence. These results are supplemented by electroluminescence images which confirm this finding.

引用

页码：12 / 18

页数：7

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