Single Event Upset Characterization of the Stratix IV Field Programmable Gate Array Using Proton Irradiation

被引：0

作者：

Chen, Qingyu ^{[1
]}

Chen, Li ^{[1
]}

Hiemstra, David M. ^{[2
]}

Kirischian, Valeri ^{[2
]}

机构：

[1] Univ Saskatchewan, Dept Elect & Comp Engn, Saskatoon, SK, Canada

[2] MDA, Brampton, ON L6S 4J3, Canada

来源：

2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2018年

基金：

加拿大自然科学与工程研究理事会;

关键词：

single event upset; SRAM FPGA; proton irradiation; Stratix IV;

D O I：

暂无

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Proton induced SEU cross-sections of certain functional blocks of the Stratix IV FPGA are presented. Upset rates in the space radiation environment are estimated.

引用

页码：316 / 320

页数：5

共 50 条

[1] Single Event Upset Characterization of the Cyclone V Field Programmable Gate Array Using Proton Irradiation
Chen, Qingyu
Chen, Li
Hiemstra, David M.
Kirischian, Valeri
2019 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2019, : 162 - 166
[2] Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation
Hiemstra, David M.
Kirischian, Valeri
Brelski, Jakub
2016 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2016, : 170 - 174
[3] Single Event Upset Characterization of the Spartan-6 Field Programmable Gate Array Using Proton Irradiation
Hiemstra, David M.
Kirischian, Valeri
2013 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2013,
[4] Single event upset characterization of the Virtex-4 field programmable gate array using proton irradiation
Hiemstra, David M.
Chayab, Fayez
Mohammed, Zaeem
NSREC: 2006 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2006, : 105 - +
[5] Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation
Hiemstra, David M.
Kirischian, Valeri
2012 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2012,
[6] Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation
Hiemstra, David M.
Kirischian, Valeri
2014 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2014,
[7] Single Event Upset Characterization of a Mixed-Signal Field Programmable Gate Array Using Proton Irradiation
Hiemstra, David M.
Gill, Prab
2011 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2011, : 88 - 91
[8] Part II: Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation
Hiemstra, David M.
Kirischian, Valeri
2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2018, : 185 - 188
[9] Part II: Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation
Hiemstra, DM
Chayab, F
NSREC: 2005 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2005, : 46 - 50
[10] Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
Hiemstra, DM
Chayab, F
Szajek, L
2004 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2004, : 79 - 84

← 1 2 3 4 5 →