Temperature-dependent high-resolution resonant photoemission study of Ce

被引:7
|
作者
Higashiguchi, M [1 ]
Shimada, K
Narimura, T
Namatame, H
Taniguchi, M
机构
[1] Hiroshima Univ, Grad Sch Sci, Higashihiroshima 7398526, Japan
[2] Hiroshima Univ, Hiroshima Synchrotron Radiat Ctr, Higashihiroshima 7398526, Japan
关键词
Ce; high-resolution photoemission; 4f-electron;
D O I
10.1016/j.physb.2004.06.018
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The 4f and 5d derived states of polycrystalline Ce thin film in the alpha- and gamma-phases have been clarified in detail by means of high-resolution photoemission spectroscopy by controlling sample temperature, excitation energy, and emission angle. The Ce 4f states from the topmost atoms are evaluated by the off-normal emission (theta = 70degrees) spectra. In the alpha-phase the c-f hybridization strength at surface is weaker compared with that from deeper region while in the gamma-phase it remains almost unchanged. The ratio of the spectral intensity Ce 4f(1)/Ce 4f(0) becomes stronger from the gamma-phase to the a-phase, indicating that the c-f hybridization becomes stronger on cooling. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:256 / 258
页数:3
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