Calibration of the torsional spring constant and the lateral photodiode response of frictional force microscopes

被引：69

作者：

Feiler, A ^{[1
]}

Attard, P ^{[1
]}

Larson, I ^{[1
]}

机构：

[1] Univ S Australia, Ian Wark Res Inst, Mawson Lakes, SA 5095, Australia

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 07期

关键词：

D O I：

10.1063/1.1150686

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a direct one-step technique to measure the torsional spring constant of cantilevers used for lateral or friction measurements with the atomic force microscope. The method simultaneously calibrates the photodiode response to the angular deflection of the cantilever. It does not rely upon any approximate theory for friction, nor upon any simplified model cantilever geometry or elasticity. The technique is verified by comparison with the calculated spring constant and with an independent measurement of the angle calibration. This nondestructive calibration may be performed with any type of cantilever, and the friction may subsequently be measured with any type of substrate or probe. (C) 2000 American Institute of Physics. [S0034-6748(00)01507-0].

引用

页码：2746 / 2750

页数：5

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