Thin film surfaces suitable to multimodal ionization for TOF-SIMS and LDI mass spectrometry of biomolecules

被引:1
作者
Kim, Shin Hye [1 ,2 ]
Shon, Hyun Kyong [1 ]
Lee, Tae Geol [1 ]
Han, Sang Yun [3 ]
机构
[1] Korea Res Inst Stand & Sci, Ctr Nanobio Convergence, Taejon 305340, South Korea
[2] Chungnam Natl Univ, Dept Chem, Taejon 305764, South Korea
[3] Gachon Univ, Dept Nanochem, Songnam 461701, Gyeonggi Do, South Korea
关键词
TOF-SIMS; LDI MS; multimodal ionization; sample plates;
D O I
10.1002/sia.5515
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report that the flat surfaces of thin films (50-nm-thick Si and Au) prepared on thermal insulator (SiO2) substrates provide versatile sample plates exhibiting multimodality for TOF-SIMS and LDI MS (laser desorption ionization mass spectrometry). Previously, the crystalline Si thin film was reported to be applicable to matrix-free LDI of biomolecules using SOI (silicon-on-insulator) wafers. One of the benefits from the previous LDI method is that various surface materials can be employed while still maintaining LDI performance, including materials that are also amenable to TOF-SIMS ionization. In this work, we demonstrate that SOI wafers (50-nm-thick Si on SiO2) and Au thin films (50-nm-thick Au on glass wafer) display sensitive ionization of peptide and drug molecules both in TOF-SIMS and LDI MS, offering an important platform for multimodal ionization that will open a new opportunity combining unique advantages of each mass spectrometry for bimolecular detection. Copyright (c) 2014 John Wiley & Sons, Ltd.
引用
收藏
页码:35 / 38
页数:4
相关论文
共 11 条
[1]   Mass spectrometry-based proteomics [J].
Aebersold, R ;
Mann, M .
NATURE, 2003, 422 (6928) :198-207
[2]   The effect of thin oxide film on protein sample measurement with TOF-SIMS [J].
Aoyagi, Satoka ;
Inoue, Masae ;
Mitsuoka, Takuya .
SURFACE AND INTERFACE ANALYSIS, 2011, 43 (1-2) :272-276
[3]   The desorption process in MALDI [J].
Dreisewerd, K .
CHEMICAL REVIEWS, 2003, 103 (02) :395-425
[4]   Surface spectrometry using large argon clusters [J].
Kayser, S. ;
Rading, D. ;
Moellers, R. ;
Kollmer, F. ;
Niehuis, E. .
SURFACE AND INTERFACE ANALYSIS, 2013, 45 (01) :131-133
[5]   Commercial Silicon-on-Insulator (SOI) Wafers as a Versatile Substrate for Laser Desorption/Ionization Mass Spectrometry [J].
Kim, Shin Hye ;
Kim, Jeongkwon ;
Moon, Dae Won ;
Han, Sang Yun .
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 2013, 24 (01) :167-170
[6]   ToF-SIMS as a tool for metabolic profiling small biomolecules in cancer systems [J].
Kotze, Helen L. ;
Armitage, Emily G. ;
Fletcher, John S. ;
Henderson, Alex ;
Williams, Kaye J. ;
Lockyer, Nicholas P. ;
Vickerman, John C. .
SURFACE AND INTERFACE ANALYSIS, 2013, 45 (01) :277-281
[7]   Clathrate nanostructures for mass spectrometry [J].
Northen, Trent R. ;
Yanes, Oscar ;
Northen, Michael T. ;
Marrinucci, Dena ;
Uritboonthai, Winnie ;
Apon, Junefredo ;
Golledge, Stephen L. ;
Nordstrom, Anders ;
Siuzdak, Gary .
NATURE, 2007, 449 (7165) :1033-U3
[8]   Matrix-free methods for laser desorption/ionization mass spectrometry [J].
Peterson, Dominic S. .
MASS SPECTROMETRY REVIEWS, 2007, 26 (01) :19-34
[9]   Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams [J].
Sheraz nee Rabbani, Sadia ;
Barber, Andrew ;
Fletcher, John S. ;
Lockyer, Nicholas P. ;
Vickerman, John C. .
ANALYTICAL CHEMISTRY, 2013, 85 (12) :5654-5658
[10]   Desorption-ionization mass spectrometry on porous silicon [J].
Wei, J ;
Buriak, JM ;
Siuzdak, G .
NATURE, 1999, 399 (6733) :243-246