An analytical subthreshold current model for ballistic quantum-wire double-gate MOS transistors

被引:7
|
作者
Autran, JL
Munteanu, D
Tintori, O
Decarre, E
Ionescu, AM
机构
[1] CNRS, UMR 6137, Lab Mat & Microelect Provence, F-13384 Marseille 13, France
[2] Swiss Fed Inst Technol, Elect Labs LEG, CH-1015 Lausanne, Switzerland
[3] Inst Univ France, Paris, France
关键词
ballistic transport; double-gate devices; analytical modeling; subthreshold current model;
D O I
10.1080/0892702051233132
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The subthreshold characteristic of ultra-thin (i.e. quantum-wire), ultra-short double-gate transistors (symmetric structures) working in the ballistic regime has been analytically modeled. This model takes into account short-channel effects, quantization effects and source-to-drain tunneling (WKB approximation) in the expression of the subthreshold drain current. Important device parameters, such as I off -current or subthreshold swing, can be easily evaluated through this full analytical approach, which also provides a complete set of equations for developing equivalent-circuit model used in ICs simulation.
引用
收藏
页码:179 / 183
页数:5
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