Analysis of regrowth evolution around VCSEL type mesas

被引:4
作者
Messmer, ER [1 ]
Lourdudoss, S [1 ]
机构
[1] Royal Inst Technol, Dept Elect, Lab Semicond Mat, S-16440 Kista, Sweden
关键词
selective epitaxy; regrowth; InP; vapour phase epitaxy; VCSEL;
D O I
10.1016/S0022-0248(00)00556-X
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Morphological evolution during hydride vapour phase epitaxial regrowth of InP around vertical cavity surface emitting laser type mesas is studied by varying the input InCl partial pressure. The various emerging planes, indices of which are orientation dependent, have been identified and their growth rates measured. The nature of the emerging planes depends on whether (111)A or (111)B plane is formed initially: further growth relies heavily on how well (111)A or (111)B can collaborate with (001) surface. This is explained in terms of crystallographic structure together with the dangling bond approach. Equal planarisation on the orthogonal directions is feasible at lower InCl partial pressures. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:185 / 192
页数:8
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