Characterization of organic photovoltaic devices using femtosecond laser induced breakdown spectroscopy

被引:12
作者
Banerjee, S. P. [1 ]
Sarnet, Thierry [1 ]
Siozos, Panayiotis [2 ]
Loulakis, Michalis [2 ]
Anglos, Demetrios [2 ,3 ]
Sentis, Marc [1 ]
机构
[1] Aix Marseille Univ, CNRS, LP3, F-13288 Marseille, France
[2] Fdn Res & Technol Hellas IESL FORTH, Inst Elect Struct & Laser, POB 1385, Iraklion 71110, Crete, Greece
[3] Univ Crete, Dept Chem, POB 2208, GR-71003 Iraklion, Crete, Greece
基金
欧盟地平线“2020”;
关键词
LIBS; Femtosecond; Organic solar cell; Selective ablation; Depth profiling; DEPTH-RESOLVED ANALYSIS; SELECTIVE ABLATION; SOLAR-CELLS; LIBS; SPECTROMETRY; ABSORPTION; COATINGS; SPECTRA; SAMPLES;
D O I
10.1016/j.apsusc.2016.11.136
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The potential of laser induced breakdown spectroscopy (LIBS) as a non-contact probe, for characterizing organic photovoltaic devices during selective laser scribing, was investigated. Samples from organic solar cells were studied, which consisted of several layers of materials including a top electrode (Al, Mg or Mo), organic layer, bottom electrode (indium tin oxide), silicon nitride barrier layer and substrate layer situated from the top consecutively. The thickness of individual layers varies from 115 to 250 nm. LIBS measurements were performed by use of a 40 femtosecond Ti:Sapphire laser operated at very low pulse energy (<10 micro-joule) to ensure a fine depth-profiling of the very thin layers. Probing a fixed spot on the sample with successive laser pulses, produced plasma emission spectra corresponding to individual laser ablation events. This enabled discrimination of the different layers on the basis of characteristic spectral lines reflecting key elemental constituents of each layer in the organic solar cell structure, demonstrating the potential of LIBS for fast, non-contact characterization of organic photovoltaic coatings. (C) 2016 The Author(s). Published by Elsevier B.V.
引用
收藏
页码:542 / 547
页数:6
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