Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond

被引：23

作者：

Lesiak, Beata ^{[1
]}

Zemek, Josef ^{[2
]}

Houdkova, Jana ^{[2
]}

Kromka, Alexander ^{[2
]}

Jozwik, Adam ^{[3
,4
]}

机构：

[1] Polish Acad Sci, Inst Phys Chem, PL-01224 Warsaw, Poland

[2] Acad Sci Czech Republ, Inst Phys, Prague 16253 6, Czech Republic

[3] Polish Acad Sci, Inst Biocybernet & Biomed Engn, PL-02109 Warsaw, Poland

[4] Tech Univ Lodz, Dept Comp Engn, PL-90924 Lodz, Poland

来源：

ANALYTICAL SCIENCES | 2010年 / 26卷 / 02期

关键词：

X-RAY PHOTOELECTRON; XPS; SPECTROSCOPY; SCATTERING; XAES;

D O I：

10.2116/analsci.26.217

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The X-ray excited Auger electron spectroscopy (XAES), X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES) methods were applied in investigating samples of nanocrystalline diamond and highly oriented pyrolytic graphite of various C sp(2)/sp(3) ratios, crystallinity conditions and grain sizes. The composition at the surface was estimated from the XPS. The C sp(2)/sp(3) ratio was evaluated from the width of the XAES first derivative C KLL spectra and from fitting of XPS C 1s spectra into components. The pattern recognition (PR) method applied for analyzing the spectra line shapes exhibited high accuracy in distinguishing different carbon materials. The PR method was found to be a potentially useful approach for identification, especially important for technological applications in fields of materials engineering and for controlling the chemical reaction products during synthesis.

引用

页码：217 / 222

页数：6

共 31 条

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