Test Beam Study of Gas Electron Multiplier (GEM) Detectors for the Upgrade of CMS Endcap Muon System

被引：0
|
作者：
Sharma, Ram Krishna [1 ]
Naimuddin, Md [1 ]
Dorney, Brian [2 ]
Merlin, Jeremie Alexandre [2 ]
Sharma, Archana [2 ]
Gruchala, Marek Michal [3 ]
Kumari, Priyanka [4 ]
Mehta, Ankita [4 ]
机构：
[1] Univ Delhi, Delhi, India
[2] CERN, Geneva, Switzerland
[3] Univ Ghent, Ghent, Belgium
[4] Panjab Univ, Chandigarh, India
来源：
XXII DAE HIGH ENERGY PHYSICS SYMPOSIUM | 2018年 / 203卷
关键词：
D O I：
10.1007/978-3-319-73171-1_40
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：179 / 183
页数：5
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