Parallelization of Rigorous Light Scattering Simulation Algorithms for Nanostructured Surfaces

被引:0
|
作者
Tausendfreund, Andreas [1 ]
Patzelt, Stefan [1 ]
Goch, Gert [1 ]
机构
[1] Univ Bremen, Fachbereich Prod Tech, BIMAQ, D-28359 Bremen, Germany
关键词
Measuring technique; scattered light; simulation; nanostructures; defect characterization; DISCRETE-DIPOLE APPROXIMATION;
D O I
10.1524/teme.2010.0051
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Scattered light measuring processes can be investigated and designed using numerical simulation. In the case of nanostructured surfaces new rigorous procedures are necessary for the computation of the scattered light. Existing approaches are not suitable because of the high computation efforts. For example, the discrete dipole approximation leads to systems with millions of coupled linear equations, which are solvable only by time consuming calculations. The paper investigates a procedure, which decouples the equations and calculates the developed subsystems in parallel on different computers.
引用
收藏
页码:215 / 220
页数:6
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