Gold coating of fiber tips in near-field scanning optical microscopy

被引:0
作者
Vikram, CS [1 ]
Witherow, WK
机构
[1] Univ Alabama, Ctr Appl Opt, Huntsville, AL 35899 USA
[2] NASA, George C Marshall Space Flight Ctr, Space Sci Lab, Huntsville, AL 35812 USA
来源
OPTIK | 2000年 / 111卷 / 09期
关键词
scanning microscopy; coating; fiber optics; micro-optics; near-field;
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report what is believed to be the first experimental demonstration of gold coating by a chemical baking process on tapered fiber tips used in near-field scanning optical microscopy. Many tips can be simultaneously coated.
引用
收藏
页码:410 / 412
页数:3
相关论文
共 28 条
[1]   Observation of nanometer-scale optical property discrimination by use of a near-field scanning apertureless microscope [J].
Bridger, PM ;
McGill, TC .
OPTICS LETTERS, 1999, 24 (15) :1005-1007
[2]   NEAR-FIELD MICROSCOPY AND NEAR-FIELD OPTICS [J].
COURJON, D ;
BAINIER, C .
REPORTS ON PROGRESS IN PHYSICS, 1994, 57 (10) :989-1028
[3]  
Danzebrink HU, 1999, J MICROSC-OXFORD, V194, P335, DOI 10.1046/j.1365-2818.1999.00505.x
[4]   New etching procedure for silver scanning tunneling microscopy tips [J].
Dickmann, K ;
Demming, F ;
Jersch, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (03) :845-846
[5]  
*ENG CORP PREC MET, EC1464 ENG CORP PREC
[6]  
Heinzelmann H, 1999, J MICROSC-OXFORD, V194, P365, DOI 10.1046/j.1365-2818.1999.00567.x
[7]   Comparison of mechanically drawn and protection layer chemically etched optical fiber tips [J].
Hoffmann, P ;
Dutoit, B ;
Salathe, RP .
ULTRAMICROSCOPY, 1995, 61 (1-4) :165-170
[8]   Evaluation of thermal evaporation conditions used in coating aluminum on near-field fiber-optic probes [J].
Hollars, CW ;
Dunn, RC .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (04) :1747-1752
[9]   Near-field probing of nanoscale nonlinear optical processes [J].
Jakubczyk, D ;
Shen, Y ;
Lal, M ;
Friend, C ;
Kim, KS ;
Swiatkiewicz, J ;
Prasad, PN .
OPTICS LETTERS, 1999, 24 (16) :1151-1153
[10]   Heating mechanisms in a near-field optical system [J].
Kann, JL ;
Milster, TD ;
Froehlich, FF ;
Ziolkowski, RW ;
Judkins, JB .
APPLIED OPTICS, 1997, 36 (24) :5951-5958