Hausdorff distance map classification using SVM

被引:0
作者
Ait Aouit, Djedjiga [1 ]
Ouahabi, Abdeldjalil [1 ]
机构
[1] Univ Tours, Polytech Sch, 7 Ave Marcel Dassault, F-37200 Tours, France
来源
IECON 2006 - 32ND ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS, VOLS 1-11 | 2006年
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
We investigate a new pattern recognition technique, based on support vector machines (SVM). Our objective is to find in database of images constituted from wooden graven, the impressions which represent the same stamps thus illustrating the same scene. In this research, the statistical classification technique that includes Hausdorff distance, similarity measures and SVM has been developed for automatic distance maps classification. These distance maps are constructed at each scale by the computation of the Hausdorff distance between two binary images through a sliding-window. The efficiency of the proposed procedure is demonstrated in terms of classification rates, robustness and computing time at multi-scale resolution.
引用
收藏
页码:3533 / +
页数:2
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