Analysis of the phenomena of non-Fourier heat conduction in switch-Q laser processing for reducing the core loss of grain-oriented silicon steel

被引:12
|
作者
Li, JD [1 ]
Gu, YQ
Guo, ZY
机构
[1] Beijing Inst Spacecraft Syst Engn, Beijing 100086, Peoples R China
[2] Tsing Hua Univ, Dept Engn Mech, Beijing 100084, Peoples R China
关键词
grain-oriented silicon steel; non-Fourier heat conduction; switch-Q laser processing;
D O I
10.1016/S0924-0136(97)00274-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In a previous study, it was found that the core loss of grain-oriented silicon steel sheets can prominently be reduced substantially by means of switch-Q laser processing: however, their coating is inevitably damaged. The experimental studies in the present paper were conducted to observe and analyse the effect of switch-Q laser processing on the domain structure, the metallographic structure and the core loss of the sheet. Two phenomena have been discovered that are difficult to explain: (i) the coating is more easily damaged; and (ii) the depth of the dislocation is much greater than predicted by means of conventional Fourier heat conduction. The two problems have been analyzed and explained by the non-Fourier heat conduction approximation. (C) 1998 Published by Elsevier Science S.A.
引用
收藏
页码:292 / 297
页数:6
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