Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps

被引:62
作者
Choi, Dongchul [1 ,2 ]
Hong, Sung-Jei [3 ]
Son, Yongkeun [1 ,2 ]
机构
[1] Sungkyunkwan Univ, Dept Chem, Suwon 440746, South Korea
[2] Sungkyunkwan Univ, PLUS Sch BK21, HRD Ctr Creat Convergence Chem Sci, Suwon 440746, South Korea
[3] Korea Elect Technol Inst, Display Components & Mat Res Ctr, Songnam 463816, South Korea
关键词
recovery; indium-tin-oxide (ITO); nanoparticle; thin film transistor-liquid crystal display (TFT-LCD) panel; scrap; PULSED-LASER DEPOSITION; THIN-FILMS; SPECTROSCOPY; DERIVATIVES; DEPENDENCE;
D O I
10.3390/ma7127662
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this study, indium-tin-oxide (ITO) nanoparticles were simply recovered from the thin film transistor-liquid crystal display (TFT-LCD) panel scraps by means of lift-off method. This can be done by dissolving color filter (CF) layer which is located between ITO layer and glass substrate. In this way the ITO layer was easily lifted off the glass substrate of the panel scrap without panel crushing. Over 90% of the ITO on the TFT-LCD panel was recovered by using this method. After separating, the ITO was obtained as particle form and their characteristics were investigated. The recovered product appeared as aggregates of particles less than 100 nm in size. The weight ratio of In/Sn is very close to 91/9. XRD analysis showed that the ITO nanoparticles have well crystallized structures with (222) preferred orientation even after recovery. The method described in this paper could be applied to the industrial recovery business for large size LCD scraps from TV easily without crushing the glass substrate.
引用
收藏
页码:7662 / 7669
页数:8
相关论文
共 19 条
[1]   Effects of stress on the structure of indium-tin-oxide thin films grown by pulsed laser deposition [J].
Adurodija, FO ;
Izumi, H ;
Ishihara, T ;
Yoshioka, H ;
Motoyama, M .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2001, 12 (01) :57-61
[2]  
[Anonymous], 2006, FACT SHEET
[3]   Synthesis, characterization, aggregation and thermal properties of a novel polymeric metal-free phthalocyanine and its metal complexes [J].
Bilgin, Ahmet ;
Yagci, Cigdem ;
Yildiz, Ufuk ;
Ozkazanc, Efsel ;
Tarcan, Erdogan .
POLYHEDRON, 2009, 28 (11) :2268-2276
[4]   Recovery of indium tin oxide (ITO) and glass plate from discarded TFT-LCD panels using an electrochemical method and acid treatment [J].
Choi, Dongchul ;
Kim, Young Sung ;
Son, Yongkeun .
RSC ADVANCES, 2014, 4 (92) :50975-50980
[5]   X-RAY PHOTOEMISSION SPECTROSCOPY STUDIES OF SN-DOPED INDIUM-OXIDE FILMS [J].
FAN, JCC ;
GOODENOUGH, JB .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) :3524-3531
[6]   Characteristics of Indium-Tin-Oxide (ITO) Glass Re-Used from Old TFT-LCD Panel [J].
Hong, Sung-Jei ;
Kim, Min-Sun ;
Kim, Jong-Woong ;
Shin, Myeongsuk .
MATERIALS TRANSACTIONS, 2012, 53 (05) :968-972
[7]   Electrical and structural properties of indium tin oxide films prepared by pulsed laser deposition [J].
Izumi, H ;
Adurodija, FO ;
Kaneyoshi, T ;
Ishihara, T ;
Yoshioka, H ;
Motoyama, M .
JOURNAL OF APPLIED PHYSICS, 2002, 91 (03) :1213-1218
[8]   X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films [J].
Kim, JS ;
Ho, PKH ;
Thomas, DS ;
Friend, RH ;
Cacialli, F ;
Bao, GW ;
Li, SFY .
CHEMICAL PHYSICS LETTERS, 1999, 315 (5-6) :307-312
[9]  
Kopacek B., 2008, P 19 WAST MAN C IWMS, P6
[10]   Dependence of the sheet resistance of indium-tin-oxide thin films on grain size and grain orientation determined from X-ray diffraction techniques [J].
Kulkarni, AK ;
Schulz, KH ;
Lim, TS ;
Khan, M .
THIN SOLID FILMS, 1999, 345 (02) :273-277