Microwave remote plasma enhanced-atomic layer deposition system with multicusp confinement chamber

被引:2
作者
Dechana, A. [1 ]
Thamboon, P. [2 ]
Boonyawan, D. [3 ]
机构
[1] Songkhla Rajabhat Univ, Fac Sci & Technol, Program Phys & Gen Sci, Songkhla 90000, Thailand
[2] Chiang Mai Univ, Sci & Technol Res Inst, Chiang Mai 50200, Thailand
[3] Chiang Mai Univ, Dept Phys & Mat Sci, Plasma & Beam Phys Res Facil, Fac Sci, Chiang Mai 50200, Thailand
关键词
THIN-FILMS; ION-SOURCE; INTERFACE; SILICON; AL2O3; ALD; XPS;
D O I
10.1063/1.4898802
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A microwave remote Plasma Enhanced-Atomic Layer Deposition system with multicusp confinement chamber is established at the Plasma and Beam Physics research facilities, Chiang Mai, Thailand. The system produces highly-reactive plasma species in order to enhance the deposition process of thin films. The addition of the multicusp magnetic fields further improves the plasma density and uniformity in the reaction chamber. Thus, the system is more favorable to temperature-sensitive substrates when heating becomes unwanted. Furthermore, the remote-plasma feature, which is generated via microwave power source, offers tunability of the plasma properties separately from the process. As a result, the system provides high flexibility in choice of materials and design experiments, particularly for low-temperature applications. Performance evaluations of the system were carried on coating experiments of Al2O3 layers onto a silicon wafer. The plasma characteristics in the chamber will be described. The resulted Al2O3 films-analyzed by Rutherford Backscattering Spectrometry in channeling mode and by X-ray Photoelectron Spectroscopy techniques-will be discussed. (C) 2014 AIP Publishing LLC.
引用
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页数:7
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