Characterization of the microstructure of severely deformed titanium by X-ray diffraction profile analysis

被引:17
作者
Gubicza, J
Dragomir, LC
Ribárik, G
Zhu, YT
Valiev, R
Ungár, T
机构
[1] Eotvos Lorand Univ, Dept Gen Phys, H-1518 Budapest, Hungary
[2] Ufa State Aviat Tech Univ, Inst Phys Adv Mat, Ufa 450000, Russia
[3] Los Alamos Natl Lab, Div Mat Sci & Technol, Los Alamos, NM 87545 USA
来源
MATERIALS SCIENCE, TESTING AND INFORMATICS | 2003年 / 414-4卷
关键词
crystallite size distribution; dislocation structure; titanium; plastic deformation; X-ray peak profile analysis;
D O I
10.4028/www.scientific.net/MSF.414-415.229
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and sigma=0.49, respectively. The dislocation slip system population was found to be 75% <a> type, 20% <c> type and 5% <c+a> type.
引用
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页码:229 / 234
页数:6
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