Incremental recrystallization/grain growth driven by elastic strain energy release in a thermomechanically fatigued lead-free solder joint

被引:99
作者
Telang, A. U.
Bieler, T. R. [1 ]
Zamiri, A.
Pourboghrat, F.
机构
[1] Michigan State Univ, Dept Chem Engn & Mat Sci, E Lansing, MI 48824 USA
[2] Michigan State Univ, Dept Mech Engn, E Lansing, MI 48824 USA
基金
美国国家科学基金会;
关键词
soldering; low cycle fatigue; electron backscatter patterns; dislocation boundaries; recrystallization texture;
D O I
10.1016/j.actamat.2006.11.023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A single shear lap solder joint specimen with lead-free eutectic Sn-Ag solder on copper substrates was exposed to 1500 thermomechanical fatigue (TMF) cycles between -15 degrees (3.5 h) and 150 degrees C (20 min) to generate intrinsic thermal strains. The 0.15-mm-thick solder joint had a cross-sectional area of 1 mm(2). Orientation imaging microscopy was used to examine changes in the tin microstructure as a function of the number of TMF cycles. The tin phase consisted of embedded minority orientations within an initial dominant orientation, which varied by about 25 degrees from one end of the joint to the other, by means of lattice curvature and low angle boundaries. Between about 150 and 750 cycles, an incremental recrystallization/grain growth process occurred where a minority solidification twin orientation grew and consumed the dominant initial orientation. An elastic FEM analysis incorporating anisotropic thermal expansion and elastic constants indicated that the final orientation had an internal stress state that was 20-100% smaller than the initial orientation, when subjected to a temperature change. The release of elastic strain energy provided the thermodynamic driving force for recrystallization/grain growth. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:2265 / 2277
页数:13
相关论文
共 65 条
[1]   Mechanical characterization of Sn-Ag-based lead-free solders [J].
Amagai, M ;
Watanabe, M ;
Omiya, M ;
Kishimoto, K ;
Shibuya, T .
MICROELECTRONICS RELIABILITY, 2002, 42 (06) :951-966
[2]   Elevated temperature aging of solder joints based on Sn-Ag-Cu: Effects on joint microstructure and shear strength [J].
Anderson, IE ;
Harringa, JL .
JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) :1485-1496
[3]  
AUST KT, 1959, T METALL SOC AIME, V251, P820
[4]  
Bastow E, 2003, ADV MATER PROCESS, V161, P26
[5]   The effect of deformation on grain growth in Zener pinned systems [J].
Bate, P .
ACTA MATERIALIA, 2001, 49 (08) :1453-1461
[6]  
BIELER TR, 2006, P ECTC
[7]  
Cahn R.W., 1996, Physical Metallurgy, V4th ed.
[8]   Oxidation study of pure tin and its alloys via electrochemical reduction analysis [J].
Cho, S ;
Yu, J ;
Kang, SK ;
Shih, DY .
JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (05) :635-642
[9]   Creep properties of Sn-Ag solder joints containing intermetallic particles [J].
Choi, S ;
Lee, JG ;
Guo, F ;
Bieler, TR ;
Subramanian, KN ;
Lucas, JP .
JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2001, 53 (06) :22-26
[10]   Microstructural characterization of damage in thermomechanically fatigued Sn-Ag based solder joints [J].
Choi, S ;
Lee, JG ;
Subramanian, KN ;
Lucas, JP ;
Bieler, TR .
JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (04) :292-297