Detection of freely propagating terahertz radiation by use of optical second-harmonic generation

被引：94

作者：

Nahata, A ^{[1
]}

Heinz, TF

机构：

[1] Columbia Univ, Dept Elect Engn, New York, NY 10027 USA

[2] Columbia Univ, Dept Phys, New York, NY 10027 USA

来源：

OPTICS LETTERS | 1998年 / 23卷 / 01期

关键词：

D O I：

10.1364/OL.23.000067

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report the application of electric-field-induced optical second-harmonic generation as a new technique for measuring the field of freely propagating terahertz radiation. Using silicon as the nonlinear medium, we demonstrate subpicosecond time resolution and a sampling signal that varies linearly with the terahertz electric field. This approach, which is attractive for centrosymmetric media, permits a significantly broadened class of materials to be exploited for free-space sampling measurements. (C) 1998 Optical Society of America.

引用

页码：67 / 69

页数：3

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