Fast simulation method for eddy current testing

被引：0

作者：

Tanaka, M ^{[1
]}

Ikeda, K ^{[1
]}

Tsuboi, H ^{[1
]}

机构：

[1] Fukuyama Univ, Dept Informat Engn, Fukuyama, Hiroshima 7290292, Japan

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2000年 / 36卷 / 04期

关键词：

eddy current testing; fast simulation; finite element methods; magnetization;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In eddy current testing (ECT) analysis, it is necessary to develop a high performance computing method for the simulation of the testing signal. The testing signal is obtained from the changes of the eddy current around a crack. In this paper, a fast computation technique for the finite element model with a small crack is proposed. In the proposed method, the region where the current changes is selected by a basis function, and only the changes of the eddy current are solved. Furthermore, a formulation of integral form to calculate the impedance of the ECT model including magnetic material is shown.

引用

页码：1728 / 1731

页数：4

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