Advanced materials for multilayer mirrors for extreme ultraviolet solar astronomy

被引:61
作者
Bogachev, S. A. [1 ]
Chkhalo, N. I. [2 ]
Kuzin, S. V. [1 ]
Pariev, D. E. [2 ]
Polkovnikov, V. N. [2 ,3 ]
Salashchenko, N. N. [2 ]
Shestov, S. V. [1 ]
Zuev, S. Y. [2 ]
机构
[1] Russian Acad Sci, PN Lebedev Phys Inst, Leninskiy Prospekt 53, Moscow, Russia
[2] Russian Acad Sci, Inst Phys Microstruct, GSP-105, Nizhnii Novgorod, Russia
[3] Nizhny Novgorod NI Lobachevskii State Univ, Ave Gagarina 23, Nizhnii Novgorod 603950, Russia
基金
俄罗斯基础研究基金会;
关键词
SOFT-X-RAY; HIGH REFLECTIVITY; MO-SI; STRESS; FILMS; STABILITY; OPTICS; EUV; REFLECTANCE; PERFORMANCE;
D O I
10.1364/AO.55.002126
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We provide an analysis of contemporary multilayer optics for extreme ultraviolet (EUV) solar astronomy in the wavelength ranges: lambda = 12.9-13.3 nm, lambda = 17-21 nm, lambda = 28-33 nm, and lambda = 58.4 nm. We found new material pairs, which will make new spaceborne experiments possible due to the high reflection efficiencies, spectral resolution, and long-term stabilities of the proposed multilayer coatings. In the spectral range lambda = 13 nm, Mo/Be multilayer mirrors were shown to demonstrate a better ratio of reflection efficiency and spectral resolution compared with the commonly used Mo/Si. In the spectral range lambda = 17-21 nm, a new multilayer structure Al/Si was proposed, which had higher spectral resolution along with comparable reflection efficiency compared with the commonly used Al/Zr multilayer structures. In the spectral range lambda = 30 nm, the Si/B4C/Mg/Cr multilayer structure turned out to best obey reflection efficiency and long-term stability. The B4C and Cr layers prevented mutual diffusion of the Si and Mg layers. For the spectral range lambda = 58 nm, a new multilayer Mo/Mg-based structure was developed; its reflection efficiency and long-term stability have been analyzed. We also investigated intrinsic stresses inherent for most of the multilayer structures and proposed possibilities for stress elimination. (C) 2016 Optical Society of America
引用
收藏
页码:2126 / 2135
页数:10
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  • [1] Andreev S. S., 2005, COMPENSATION ELASTIC, P45
  • [2] Multilayer optics for XUV spectral region: technology fabrication and applications
    Andreev, SS
    Akhsakhalyan, AD
    Bibishkin, MA
    Chkhalo, NI
    Gaponov, SV
    Gusev, SA
    Kluenkov, EB
    Prokhorov, KA
    Salashchenko, NN
    Schafers, F
    Zuev, SY
    [J]. CENTRAL EUROPEAN JOURNAL OF PHYSICS, 2003, 1 (01): : 191 - 209
  • [3] The microstructure and X-ray reflectivity of Mo/Si multilayers
    Andreev, SS
    Gaponov, SV
    Gusev, SA
    Haidl, MN
    Kluenkov, EB
    Prokhorov, KA
    Polushkin, NI
    Sadova, EN
    Salashchenko, NN
    Suslov, LA
    Zuev, SY
    [J]. THIN SOLID FILMS, 2002, 415 (1-2) : 123 - 132
  • [4] Stress reduction of Mo/Si multilayer structures
    Andreev, SS
    Salashchenko, NN
    Suslov, LA
    Yablonsky, AN
    Zuev, SY
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 470 (1-2) : 162 - 167
  • [5] Tri-material multilayer coatings with high reflectivity and wide bandwidth for 25 to 50 nm extreme ultraviolet light
    Aquila, A.
    Salmassi, F.
    Liu, Yanwei
    Gullikson, E. M.
    [J]. OPTICS EXPRESS, 2009, 17 (24): : 22102 - 22107
  • [6] Precision imaging multilayer optics for soft X-rays and extreme ultraviolet bands
    Barysheva, M. M.
    Pestov, A. E.
    Salashchenko, N. N.
    Toropov, M. N.
    Chkhalo, N. I.
    [J]. PHYSICS-USPEKHI, 2012, 55 (07) : 681 - 699
  • [7] Barysheva M. M., 2013, FUNDAMENTALS PICOSCI, P595
  • [8] Interdiffusion in amorphous Nb/Si multilayers
    Bochnícek, Z
    Vávra, I
    [J]. MATERIALS LETTERS, 2000, 45 (02) : 120 - 124
  • [9] Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet optics
    Chkhalo, N. I.
    Churin, S. A.
    Mikhaylenko, M. S.
    Pestov, A. E.
    Polkovnikov, V. N.
    Salashchenko, N. N.
    Zorina, M. V.
    [J]. APPLIED OPTICS, 2016, 55 (06) : 1249 - 1256
  • [10] Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics
    Chkhalo, N. I.
    Churin, S. A.
    Pestov, A. E.
    Salashchenko, N. N.
    Vainer, Yu. A.
    Zorina, M. V.
    [J]. OPTICS EXPRESS, 2014, 22 (17): : 20094 - 20106