Active pixel sensors for imaging X-ray spectrometers

被引：5
|
作者：
Holl, P [1 ]
Fischer, P [1 ]
Hartmann, R [1 ]
Hasinger, G [1 ]
Kollmer, J [1 ]
Krause, N [1 ]
Lechner, P [1 ]
Lutz, G [1 ]
Meidinger, N [1 ]
Peric, I [1 ]
Richter, R [1 ]
Soltau, H [1 ]
Strüder, L [1 ]
Treis, J [1 ]
Trümper, J [1 ]
Wermes, N [1 ]
机构：
[1] PNSensor GMBH, D-80803 Munich, Germany
来源：
X-RAY AND GAMMA-RAY TELESCOPES AND INSTRUMENTS FOR ASTRONOMY, PTS 1 AND 2 | 2003年 / 4851卷
关键词：
pixel detectors; CCDs; XEUS; XMM-Newton; drift detectors; X-ray; imaging; spectroscopy;
D O I：
10.1117/12.461356
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
Active Pixel Sensors (APS) offer high-resolution imaging in combination with a fast and flexible readout. The MPI Halbleiterlabor develops and produces DEPFET (Depleted Field Effect Transistor, [1]) based APS devices. They are additionally characterized by enhanced sensitivity for X-ray photons in the range from 0.1 keV to 25 keV, spectroscopic energy resolution (below 1 electron r.m.s.) and radiation hardness. Moreover, the production process on high-ohmic silicon allows incorporating additional high-speed spectrometers based on silicon drift detectors. Such a detector system is proposed as a wide field imager for the XEUS (X-ray Evolving Universe Spectroscopy) mission. XEUS is a planned project within the European Space Agency's Horizon 2000+ program. We will present a focal plane concept for XEUS and measurement results from DEPFET-APS prototypes and high speed drift detectors.
引用
收藏
页码：770 / 778
页数：9
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