Single-photon avalanche diodes in 0.18-μm high-voltage CMOS technology

被引:31
作者
Huang, L. D. [1 ]
Wu, J. Y. [2 ]
Wang, J. P. [1 ]
Tsai, C. M. [1 ]
Huang, Y. H. [1 ]
Wu, D. R. [1 ]
Lin, S. D. [1 ]
机构
[1] Natl Chiao Tung Univ, Dept Elect Engn, 1001 Univ Rd, Hsinchu 300, Taiwan
[2] Ind Technol Res Inst, Informat & Commun Res Labs, Hsinchu 310, Taiwan
关键词
TIME; NM; PHOTODIODE; RESOLUTION; DETECTOR; ARRAY; SPAD;
D O I
10.1364/OE.25.013333
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have designed and fabricated high-performance single-photon avalanche diodes (SPADs) by using 0.18-mu m high-voltage CMOS technology. Without any technology customization. the SPADs have low dark-count rate, high photon-detection probability, low afterpulsing probability, and acceptable timing jitter and breakdown voltage. Our design provides a low-cost and high-performance SPAD for various applications. (C) 2017 Optical Society of America
引用
收藏
页码:13333 / 13339
页数:7
相关论文
共 25 条
[11]   Single photon avalanche photodetector with integrated quenching fabricated in TSMC 0.18 μm 1.8 VCMOS process [J].
Marwick, M. A. ;
Andreou, A. G. .
ELECTRONICS LETTERS, 2008, 44 (10) :643-U42
[12]  
Niclass C., 2005, IEEE INT SOL STAT CI, P363
[13]   A single photon avalanche diode implemented in 130-nm CMOS technology [J].
Niclass, Cristiano ;
Gersbach, Marek ;
Henderson, Robert ;
Grant, Lindsay ;
Charbon, Edoardo .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2007, 13 (04) :863-869
[14]   A 0.18-μm CMOS SoC for a 100-m-Range 10-Frame/s 200 x 96-Pixel Time-of-Flight Depth Sensor [J].
Niclass, Cristiano ;
Soga, Mineki ;
Matsubara, Hiroyuki ;
Ogawa, Masaru ;
Kagami, Manabu .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2014, 49 (01) :315-330
[15]   Characterization and Modeling of Breakdown Probability in Sub-Micrometer CMOS SPADs [J].
Pancheri, Lucio ;
Stoppa, David ;
Betta, Gian-Franco Dalla .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2014, 20 (06) :328-335
[16]   Low Dark Count Single-Photon Avalanche Diode Structure Compatible With Standard Nanometer Scale CMOS Technology [J].
Richardson, Justin A. ;
Grant, Lindsay A. ;
Henderson, Robert K. .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2009, 21 (14) :1020-1022
[17]   First passively-quenched single photon counting avalanche photodiode element integrated in a conventional CMOS process with 32ns dead time [J].
Rochas, A ;
Ribordy, G ;
Furrer, B ;
Besse, PA ;
Popovic, RS .
APPLICATIONS OF PHOTONIC TECHNOLOGY 5: CLOSING THE GAP BETWEEN THEORY, DEVELOPMENT, AND APPLICATION, 2002, 4833 :107-115
[18]   Single photon detector fabricated in a complementary metal-oxide-semiconductor high-voltage technology [J].
Rochas, A ;
Gani, M ;
Furrer, B ;
Besse, PA ;
Popovic, RS ;
Ribordy, G ;
Gisin, N .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (07) :3263-3270
[19]   A Single-Photon Avalanche Diode Array for Fluorescence Lifetime Imaging Microscopy [J].
Schwartz, David Eric ;
Charbon, Edoardo ;
Shepard, Kenneth L. .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2008, 43 (11) :2546-2557
[20]  
Sze S.M., 2013, SEMICONDUCTOR DEVICE