3D multi-layer vision architecture for surveillance and reconnaissance applications
被引:4
作者:
Foeldesy, Peter
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h-index: 0
机构:
Hungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, HungaryHungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
Foeldesy, Peter
[1
]
Carmona-Galan, Ricardo
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h-index: 0
机构:
IMSE, CNM, Seville, SpainHungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
Carmona-Galan, Ricardo
[2
]
Zarandy, Akos
论文数: 0引用数: 0
h-index: 0
机构:
Hungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, HungaryHungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
Zarandy, Akos
[1
]
Rekeczky, Csaba
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h-index: 0
机构:
Eutecus Inc, Berkeley, CA USAHungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
Rekeczky, Csaba
[3
]
Rodriguez-Vazquez, Angel
论文数: 0引用数: 0
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机构:
AnaFocus, Seville, SpainHungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
Rodriguez-Vazquez, Angel
[4
]
Roska, Tamas
论文数: 0引用数: 0
h-index: 0
机构:
Hungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, HungaryHungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
Roska, Tamas
[1
]
机构:
[1] Hungarian Acad Sci, Comp & Automat Res Inst, MTA SZTAKI, Budapest, Hungary
[2] IMSE, CNM, Seville, Spain
[3] Eutecus Inc, Berkeley, CA USA
[4] AnaFocus, Seville, Spain
来源:
2009 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN, VOLS 1 AND 2
|
2009年
关键词:
D O I:
10.1109/ECCTD.2009.5274944
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The architecture and the design details of a multi-layer combined mixed-signal and digital sensor-processor array chip is shown. The processor layers are fabricated with 3D integration technology, and the sensor layer is integrated via bump bonding technology. The chip is constructed of a 320x240 sensor array layer, closely coupled with a 160x120 mixed-signal processor array layer, a digital frame buffer layer, and an 8x8 digital fovea processor array layer. The chip is designed to solve image registration and feature extraction above 1000FPS.