Thickness Dependence of Space-Charge-Limited Current in Spatially Disordered Organic Semiconductors

被引:42
作者
Zubair, Muhammad [1 ,2 ]
Ang, Yee Sin [1 ]
Ang, Lay Kee [1 ]
机构
[1] Singapore Univ Technol & Design, SUTD MIT Int Design Ctr, Singapore 487372, Singapore
[2] Informat Technol Univ, Dept Elect Engn, Lahore 54000, Pakistan
关键词
Disorderedmedia; fractalmedia; fractional dimension; organic semiconductors; space charge limited current (SCLC); thickness dependence; POLY(P-PHENYLENE VINYLENE); TRANSPORT; MOBILITY; TEMPERATURE; INJECTION; FILMS; FIELD;
D O I
10.1109/TED.2018.2841920
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Charge transport properties in organic semiconductors are determined by two kinds of microscopic disorders, namely, energetic disorder related to the distribution of localized states and the spatial disorder related to the morphological features of the material. From a semiclassical picture, the charge transport properties are crucially determined by both the carrier mobility and the electrostatic field distribution in the material. Although the effect of disorders on carriermobility has been widely studied, how electrostatic field distribution is distorted by the presence of disorders and its effect on charge transport remain unanswered. In this paper, we present a modified space-charge-limited current (SCLC) model for spatially disordered organic semiconductors based on the fractional-dimensional electrostatic framework. We show that the thickness dependence of the SCLC is related to the spatial disorder in organic semiconductors. For trap-free transport, the SCLC exhibits a modified thickness scaling of J alpha L-3 alpha, where the fractional-dimensional parameter alpha accounts for the spatial disorder in organic semiconductors. The trap-limited and field-dependent mobility are also shown to obey an alpha-dependent thickness scaling. The modified SCLC model shows good agreement with several experiments on spatially disordered organic semiconductors. By applying this model to the experimental data, the standard charge transport parameters can be deduced with better accuracy than by using existing models.
引用
收藏
页码:3421 / 3429
页数:9
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