Increasing the accuracy of thermal transient measurements

被引：23

作者：

Székely, V ^{[1
]}

Rencz, M ^{[1
]}

机构：

[1] Budapest Univ Technol & Econ, Dept Electron Devices, H-1521 Budapest, Hungary

来源：

IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2002年 / 25卷 / 04期

关键词：

heating curve; nonlinear models; pulse powering; structure function; thermal nonlinearities; thermal transient measurements; transient thermal testing;

D O I：

10.1109/TCAPT.2002.808002

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Recent developments in the methodology of thermal transient measurements and evaluation are discussed in the paper. All of them are aimed at increasing the accuracy of these measurements and their evaluation. After a short summary of the evaluation, methodology a procedure is presented for the correction of the nonconstant powering. New methods are presented for the compensation, evaluation and modeling of the nonlinearities. Various aspects of pulsed powering are discussed in details.

引用

页码：539 / 546

页数：8

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