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High-resolution atomic force microscopy of duplex and triplex DNA molecules
被引:45
作者:
Klinov, Dmitry
Dwir, Benjamin
Kapon, Eli
Borovok, Natalia
Molotsky, Tatiana
Kotlyar, Alexander
机构:
[1] Ecole Polytech Fed Lausanne, Lab Phys Nanostruct, CH-1015 Lausanne, Switzerland
[2] Russian Acad Sci, Shemyakin Ovchinnikov Inst Bioorgan Chem, Moscow, Russia
[3] Tel Aviv Univ, George S Wise Fac Life Sci, Dept Biochem, IL-69978 Tel Aviv, Israel
[4] Tel Aviv Univ, Inst Nanosci, IL-69978 Tel Aviv, Israel
关键词:
D O I:
10.1088/0957-4484/18/22/225102
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Double-stranded poly(dG) - poly(dC) and triple-stranded poly( dG) - poly( dG) - poly( dC) DNA were deposited on the modified surface of highly oriented pyrolitic graphite ( HOPG) and visualized using atomic force microscopy with high-resolution ( radius of similar to 1 nm) tips. The high resolution attained by this technique enabled us to detect single-stranded regions in double-stranded poly( dG) - poly( dC) and double-stranded and single-stranded regions in poly( dG) - poly( dG) - poly( dC) triplexes, as well as to resolve the helical pitch of the triplex molecules. We could also follow the reaction of G-strand extension in poly( dG) - poly( dC) by the Klenow exo(-) fragment of DNA polymerase I. This approach to molecular visualization could serve as a useful tool for the investigation of irregular structures in canonical DNA and other biopolymers, as well as studies of the molecular mechanisms of DNA replication and transcription.
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