Nucleation and growth of InN thin films using conventional and pulsed MOVPE

被引:49
作者
Johnson, MC
Konsek, SL
Zettl, A
Bourret-Courchesne, ED
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Ctr Adv Mat, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
nucleation; photoluminescence; scanning electron microscopy; metalorganic chemical vapor deposition; indium nitride (InN); nitrides;
D O I
10.1016/j.jcrysgro.2004.08.057
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
InN was deposited on c-sapphire and GaN substrates using conventional and pulsed metalorganic vapor-phase epitaxy. The nucleation and evolution of thin film growth was investigated. Growth temperature, V/III molar ratio, and substrate material were varied for the two different growth modes (conventional vs. pulsed MOCVD). It was found that InN deposition was sensitive to V/III molar ratio and growth temperature. Photoluminescence results show a peak emission at 0.83 eV. Results are presented that show the highest quality InN was deposited using pulsed metalorganic vapor-phase Epitaxy on GaN substrates. (C) 2004 Published by Elsevier B.V.
引用
收藏
页码:400 / 406
页数:7
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