A comparative study of uniaxial pressure effects in intraband AlGaAs/GaAs and interband InAs/AlSb/GaSb resonant tunneling diodes

被引:13
作者
Mutamba, K [1 ]
Sigurdardottir, A
Vogt, A
Hartnagel, HL
Li, EH
机构
[1] Tech Univ Darmstadt, Inst Hochfrequenztech, D-64283 Darmstadt, Germany
[2] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong
关键词
D O I
10.1063/1.121135
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the effects of uniaxial pressure on (001)-oriented AlGaAs/GaAs and InAs/AlSb/GaSb double barrier resonant tunneling diodes (RTDs). The current-voltage characteristics of the AlGaAs/GaAs RTDs shift asymmetrically due to stress-induced piezoelectric fields in the barriers and well structures. Although all the materials involved are piezoelectric, the interband InAs/AlSb/GaSb resonant tunneling device surprisingly shows, in contrast to the AlGaAs/GaAs one, a symmetrical behavior for the same orientation [110] of the applied pressure. We explain the observed differences considering the different tunneling paths involved in the conduction mechanism of the two heterostructure devi-e types as well as their pressure dependencies. (C) 1998 American Institute of Physics.
引用
收藏
页码:1629 / 1631
页数:3
相关论文
共 17 条
[1]   THE PRESSURE-DEPENDENCE OF THE TUNNELING CURRENT IN SINGLE-BARRIER ALAS/GAAS STRUCTURES [J].
AUSTING, DG ;
KLIPSTEIN, PC ;
ROBERTS, JS ;
HILL, G .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (05) :616-623
[2]  
AUSTING DG, 1991, NATO ADV SCI I B-PHY, V277, P157
[3]  
BHYKHOVSKI AD, 1997, J APPL PHYS, V81, P6332
[4]   A PIEZORESISTIVE GAAS PRESSURE SENSOR WITH GAAS/ALGAAS MEMBRANE TECHNOLOGY [J].
DEHE, A ;
FRICKE, K ;
MUTAMBA, K ;
HARTNAGEL, HL .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 1995, 5 (02) :139-142
[5]   The physics and technology of gallium antimonide: An emerging optoelectronic material [J].
Dutta, PS ;
Bhat, HL ;
Kumar, V .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) :5821-5870
[6]   A GAAS PRESSURE SENSOR-BASED ON RESONANT-TUNNELING DIODES [J].
FOBELETS, K ;
VOUNCKX, R ;
BORGHS, G .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 1994, 4 (03) :123-128
[7]   PRESSURE MEASUREMENT BY GAAS PIEZOELECTRIC SENSORS [J].
FRICKE, K ;
HARTNAGEL, HL .
ELECTRONICS LETTERS, 1990, 26 (11) :693-694
[8]   MICROWAVE PERFORMANCE OF A QUARTER-MICROMETER GATE LOW-NOISE PSEUDOMORPHIC INGAAS/ALGAAS MODULATION-DOPED FIELD-EFFECT TRANSISTOR [J].
HENDERSON, T ;
AKSUN, MI ;
PENG, CK ;
MORKOC, H ;
CHAO, PC ;
SMITH, PM ;
DUH, KHG ;
LESTER, LF .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (12) :649-651
[9]   CYCLOTRON RESONANCE EXPERIMENTS IN UNIAXIALLY STRESSED SILICON - VALENCE BAND INVERSE MASS PARAMETERS AND DEFORMATION POTENTIALS [J].
HENSEL, JC ;
FEHER, G .
PHYSICAL REVIEW, 1963, 129 (03) :1041-&
[10]  
HJORT K, 1993, THESIS U UPPSALA SWE