Fine grinding of silicon wafers: machine configurations for spindle angle adjustments

被引:26
作者
Sun, WP
Pei, ZJ
Fisher, GR
机构
[1] Kansas State Univ, Dept Ind & Mfg Syst Engn, Manhattan, KS 66506 USA
[2] MEMC Elect Mat Inc, St Petersburg, MO 63376 USA
基金
美国国家科学基金会;
关键词
grinder; grinding; machine design; machining; semiconductor material; silicon wafer;
D O I
10.1016/j.ijmachtools.2004.06.013
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper addresses an important aspect of silicon wafer fine grinding: machine design. For any commercially available wafer grinders, spindle angle adjustments based on the wafer shape ground is almost inevitable in order to achieve flat wafers. However, there has been no commonly accepted guidance for the design of machine configurations to ensure the easiest adjustment. Practitioners doing spindle angle adjustments have been frustrated by the difficulties of achieving the adjustments on commercial wafer grinders. This paper first illustrates such difficulties with a machine configuration frequently cited in the literature. It then demonstrates the potential ease of spindle angle adjustments with a proposed machine configuration. Next, it shows mathematically that the proposed configuration (specifically, a pair of the axes for spindle angle adjustments) is uniquely determined once the wheel diameter and wafer diameter are known. It also shows that the proposed configuration is the best in terms of ease in spindle angle adjustments. The spindle angle adjustments will be more difficult with any other configurations deviating from the proposed one. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:51 / 61
页数:11
相关论文
共 50 条
  • [21] A grinding-based manufacturing method for silicon wafers: Generation mechanisms of central bumps on ground wafers
    Sun, Wangping
    Pei, Z. J.
    Fisher, Graham R.
    MACHINING SCIENCE AND TECHNOLOGY, 2006, 10 (02) : 219 - 233
  • [22] Effects of taping on grinding quality of silicon wafers in backgrinding
    Zhigang Dong
    Qian Zhang
    Haijun Liu
    Renke Kang
    Shang Gao
    Frontiers of Mechanical Engineering, 2021, 16 : 559 - 569
  • [23] Microstructure studies of the grinding damage in monocrystalline silicon wafers
    Zhang Yinxia
    Kang Renke
    Guo Dongming
    Jin Zhuji
    RARE METALS, 2007, 26 (01) : 13 - 18
  • [24] A study on surface grinding of 300 mm silicon wafers
    Pei, ZJ
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2002, 42 (03) : 385 - 393
  • [25] Effects of taping on grinding quality of silicon wafers in backgrinding
    Dong, Zhigang
    Zhang, Qian
    Liu, Haijun
    Kang, Renke
    Gao, Shang
    FRONTIERS OF MECHANICAL ENGINEERING, 2021, 16 (03) : 559 - 569
  • [26] Microstructure studies of the grinding damage in monocrystalline silicon wafers
    ZHANG Yinxia
    RareMetals, 2007, (01) : 13 - 18
  • [27] Origin, modeling and suppression of grinding marks in ultra precision grinding of silicon wafers
    Huo, F. W.
    Kang, R. K.
    Li, Z.
    Guo, D. M.
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2013, 66 : 54 - 65
  • [28] Finite Element Analysis for Grinding and Lapping of Wire-sawn Silicon Wafers
    Z J PEI
    X J XIN
    厦门大学学报(自然科学版), 2002, (S1) : 10 - 10
  • [29] Finite element analysis for grinding and lapping of wire-sawn silicon wafers
    Liu, WJ
    Pei, ZJ
    Xin, XJ
    JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2002, 129 (1-3) : 2 - 9
  • [30] Grinding of silicon wafers using an ultrafine diamond wheel of a hybrid bond material
    Zhang, Zhenyu
    Huo, Fengwei
    Wu, Yueqin
    Huang, Han
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2011, 51 (01) : 18 - 24