Fine grinding of silicon wafers: machine configurations for spindle angle adjustments

被引:27
作者
Sun, WP
Pei, ZJ
Fisher, GR
机构
[1] Kansas State Univ, Dept Ind & Mfg Syst Engn, Manhattan, KS 66506 USA
[2] MEMC Elect Mat Inc, St Petersburg, MO 63376 USA
基金
美国国家科学基金会;
关键词
grinder; grinding; machine design; machining; semiconductor material; silicon wafer;
D O I
10.1016/j.ijmachtools.2004.06.013
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper addresses an important aspect of silicon wafer fine grinding: machine design. For any commercially available wafer grinders, spindle angle adjustments based on the wafer shape ground is almost inevitable in order to achieve flat wafers. However, there has been no commonly accepted guidance for the design of machine configurations to ensure the easiest adjustment. Practitioners doing spindle angle adjustments have been frustrated by the difficulties of achieving the adjustments on commercial wafer grinders. This paper first illustrates such difficulties with a machine configuration frequently cited in the literature. It then demonstrates the potential ease of spindle angle adjustments with a proposed machine configuration. Next, it shows mathematically that the proposed configuration (specifically, a pair of the axes for spindle angle adjustments) is uniquely determined once the wheel diameter and wafer diameter are known. It also shows that the proposed configuration is the best in terms of ease in spindle angle adjustments. The spindle angle adjustments will be more difficult with any other configurations deviating from the proposed one. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:51 / 61
页数:11
相关论文
共 50 条
[11]   Grinding wheels for manufacturing of silicon wafers: A literature review [J].
Liu, J. H. ;
Pei, Z. J. ;
Fisher, Graham R. .
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2007, 47 (01) :1-13
[12]   Fine grinding of silicon wafer: Benefits and technical barriers [J].
Pei, ZJ ;
Fisher, GR ;
Strasbaugh, A .
TRANSACTIONS OF THE NORTH AMERICAN MANUFACTURING RESEARCH INSTITUTION OF SME, VOL 32, 2004, 2004, :479-486
[13]   A grinding-based manufacturing method for silicon wafers: Decomposition analysis of wafer surfaces [J].
Lu, W. K. ;
Pei, Z. J. ;
Fisher, Graham R. .
MACHINING SCIENCE AND TECHNOLOGY, 2007, 11 (01) :81-97
[14]   An experimental investigation into soft-pad grinding of wire-sawn silicon wafers [J].
Pei, ZJ ;
Kassir, S ;
Bhagavat, M ;
Fisher, GR .
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2004, 44 (2-3) :299-306
[15]   Warping of silicon wafers subjected to back-grinding process [J].
Gao, Shang ;
Dong, Zhigang ;
Kang, Renke ;
Zhang, Bi ;
Guo, Dongming .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2015, 40 :87-93
[16]   Finite element analysis for grinding of wire-sawn silicon wafers: a designed experiment [J].
Pei, Z ;
Xin, XJ ;
Liu, W .
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2003, 43 (01) :7-16
[17]   Formation of subsurface cracks in silicon wafers by grinding [J].
Yin, Jingfei ;
Bai, Qian ;
Li, Yinnan ;
Zhang, Bi .
NANOTECHNOLOGY AND PRECISION ENGINEERING-NAMI JISHU YU JINGMI GONGCHENG, 2018, 1 (03) :172-179
[18]   Formation of subsurface cracks in silicon wafers by grinding [J].
Jingfei Yin ;
Qian Bai ;
Yinnan Li ;
Bi Zhang .
Nanotechnology and Precision Engineering, 2018, 1 (03) :172-179
[19]   Edge chipping of silicon wafers in diamond grinding [J].
Gao, Shang ;
Kang, Renke ;
Dong, Zhigang ;
Zhang, B. .
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2013, 64 :31-37
[20]   Waviness removal in grinding of wire-sawn silicon wafers: 3D finite element analysis with designed experiments [J].
Sun, XK ;
Pei, ZJ ;
Xin, XJ ;
Fouts, M .
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2004, 44 (01) :11-19