Required Characteristics for Software Reliability Growth Models

被引:3
作者
Jiang, R. [1 ]
机构
[1] Changsha Univ Sci & Technol, Sch Automot & Mech Engn, Changsha 410004, Hunan, Peoples R China
来源
2009 WRI WORLD CONGRESS ON SOFTWARE ENGINEERING, VOL 4, PROCEEDINGS | 2009年
关键词
ERROR-DETECTION;
D O I
10.1109/WCSE.2009.157
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Software reliability growth models are used to estimate and predict software quality. Many software reliability growth models (SRGM) have been developed in the literature. It is a key issue how to appropriately select them since an inappropriate SRGM can give unreasonable prediction. This paper deals with this issue. It first discusses some characteristics for a SRGM to have, then presents five flexible SRGMs, and finally discusses how to determine the best SRGM from a list of candidate models for a given set of data. The usefulness of the suggested models and method are illustrated by a real-world example. The results show that all the suggested models outperform the well-known exponential model in terms of goodness-of-fit and predictive capability.
引用
收藏
页码:228 / 232
页数:5
相关论文
共 8 条
[1]   TIME-DEPENDENT ERROR-DETECTION RATE MODEL FOR SOFTWARE RELIABILITY AND OTHER PERFORMANCE-MEASURES [J].
GOEL, AL ;
OKUMOTO, K .
IEEE TRANSACTIONS ON RELIABILITY, 1979, 28 (03) :206-211
[2]   ESTIMATING THE PARAMETERS OF A NONHOMOGENEOUS POISSON-PROCESS MODEL FOR SOFTWARE-RELIABILITY [J].
HOSSAIN, SA ;
DAHIYA, RC .
IEEE TRANSACTIONS ON RELIABILITY, 1993, 42 (04) :604-612
[3]   Analysis of incorporating logistic testing-effort function into software reliability modeling [J].
Huang, CY ;
Kuo, SY .
IEEE TRANSACTIONS ON RELIABILITY, 2002, 51 (03) :261-270
[4]   Aging property of unimodal failure rate models [J].
Jiang, R ;
Ji, P ;
Xiao, X .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2003, 79 (01) :113-116
[5]   SOFTWARE-RELIABILITY ANALYSIS MODELS [J].
OHBA, M .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1984, 28 (04) :428-443
[6]   SOFTWARE-RELIABILITY MEASUREMENT AND ASSESSMENT BASED ON NONHOMOGENEOUS POISSON-PROCESS MODELS - A SURVEY [J].
YAMADA, S ;
HISHITANI, J ;
OSAKA, S .
MICROELECTRONICS AND RELIABILITY, 1992, 32 (12) :1763-1773
[7]   S-SHAPED RELIABILITY GROWTH MODELING FOR SOFTWARE ERROR-DETECTION [J].
YAMADA, S ;
OHBA, M ;
OSAKI, S .
IEEE TRANSACTIONS ON RELIABILITY, 1983, 32 (05) :475-&
[8]   SOFTWARE-RELIABILITY GROWTH MODELING - MODELS AND APPLICATIONS [J].
YAMADA, S ;
OSAKI, S .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1985, 11 (12) :1431-1437