Nanoscale piezoresponse of 70 nm poly(vinylidene fluoride-trifluoro-ethylene) films annealed at different temperatures

被引:29
作者
Choi, Yoon-Young [2 ]
Hong, Jongin [1 ]
Hong, Seungbum [3 ]
Song, Hanwook [4 ]
Cheong, Deok-Soo [5 ]
No, Kwangsoo [2 ]
机构
[1] Univ London Imperial Coll Sci Technol & Med, Dept Chem, London SW7 2AZ, England
[2] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
[3] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
[4] Korea Res Inst Stand & Sci, Grp Stand & Basis Metrol, Taejon 305340, South Korea
[5] Dankook Univ, Dept Mat Sci & Engn, Cheonan, Chungnam, South Korea
来源
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2010年 / 4卷 / 3-4期
关键词
atomic force microscopy; dielectrics; thin films; polymers; FLUORIDE TRIFLUOROETHYLENE COPOLYMER; FIELD-EFFECT TRANSISTOR; THIN-FILMS; VINYLIDENE FLUORIDE; CRYSTALLINE; POLYMER; DEPENDENCE; MEMORY;
D O I
10.1002/pssr.201004009
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In order to characterize the piezoelectric properties of 70 nm thick poly(vinylidene fluoride-trifluoroethylene), P(VDF-TrFE), films grown by a spin-coating technique, both nanoscale manipulation and polarization switching were studied using piezoresponse force Microscopy (PFM). We varied the annealing, temperature from 75 degrees C to 145 degrees C and achieved a high-quality 70 nm P(VDF-TrFE) film annealed at the temperature of 95 degrees C. Ferroelecrtic domains and their properties were confirmed using X-ray diffraction, grazing incidence reflection absorption Fourier, Transform Infrared (GIRA-FTIR) and PFM analysis. The ferroelectric domains in the film were homogeneously switchable below 5 V with a remnant d(33) of 14.9 pm/V. This offers out rationale for a promise in energy harvesting and switchability would be good for plastic electronics. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:94 / 96
页数:3
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