Enhanced longitudinal magnetooptic Kerr effect contrast in nanomagnetic structures

被引:11
作者
Gibson, Ursula J. [1 ]
Holiday, Lindsay F.
Allwood, Dan A.
Basu, Swaraj
Fry, Paul W.
机构
[1] Dartmouth Coll, Thayer Sch Engn, Hanover, NH 03755 USA
[2] Univ Sheffield, Dept Mat Engn, Sheffield S1 3JD, S Yorkshire, England
[3] Univ Sheffield, Ctr Nanosci & Technol, Sheffield S3 7HQ, S Yorkshire, England
基金
英国工程与自然科学研究理事会;
关键词
antireflection films; dielectric coatings; magnetic nanostructures; magnetooptic Kerr effect (MOKE);
D O I
10.1109/TMAG.2007.894003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on enhanced longitudinal magnetooptic Kerr effect signal contrast in thin-film nanomagnetic disks with in-plane magnetization when combined with dielectric layers that provide impedance matching to the structure and the underlying substrate. Kerr signals can increase by a factor of three, while substrate reflectance is almost completely suppressed. This leads to an increase in Kerr ellipticity relative to the background intensity and a subsequent improvement in the measured signal-to-noise ratio. Measurements using a beam focused on opaque 400-nm Ni disks yield contrast improvements of a factor of 8. Arrays of nanodisks demonstrate more complex behavior due to diffraction effects.
引用
收藏
页码:2740 / 2742
页数:3
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