Technique for transfer of high-density, high-aspect-ratio nanoscale patterns in UV nanoimprint lithography and measurement of the release force

被引:24
作者
Taniguchi, Jun [1 ]
Kamiya, Yasuhiro [1 ]
Ohsaki, Takeshi [2 ]
Sakai, Nobuji [2 ]
机构
[1] Tokyo Univ Sci, Dept Appl Elect, Nada Ku, Chiba 2788510, Japan
[2] Toyo Gosei Co Ltd, Photosensit Mat Res Ctr, Inba, Chiba 2701609, Japan
关键词
Nanoimprint lithography (NIL); UV photocurable resin; Glassy carbon; Antireflective structure; Release force; Aspect ratio; FABRICATION;
D O I
10.1016/j.mee.2009.12.051
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ultraviolet nanoimprint lithography (UV-NIL) is a powerful tool for nanoscale fabrication. However, the replication of high-density, high-aspect-ratio mold patterns by UV-NIL is very difficult because of the strong forces required to release the replicate from the mold. We used a glassy carbon (GC) mold with an antireflective structure, fabricated by irradiation with an oxygen-ion beam, to produce a high-density, high-aspect-ratio pattern, and we evaluated its release properties. The fabricated GC surface contained high-aspect-ratio conical structures with pitch of less than 100 nm. After fabrication of the antireflective structure, the mold surface was coated with chromium and a fluorinated silane coupling agent. By using this treatment and a peel motion during mold release, faithful replication of the mold structure in photo-curable resin was possible. The release force increased with increasing mold surface area; the surface area effect is therefore the main factor in the mold-release step. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:859 / 863
页数:5
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