Dielectric function of GaN: model calculations

被引:0
作者
Djurisic, AB [1 ]
Li, EH [1 ]
机构
[1] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China
来源
OPTOELECTRONIC MATERIALS AND DEVICES II | 2000年 / 4078卷
关键词
optical properties; gallium nitride;
D O I
10.1117/12.392178
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work we have modeled the optical functions of hexagonal GaN (corresponding to E perpendicular to c) in the range from 1 eV to 10 eV using a modified critical points model. The difference between the model employed and the standard critical points model is that the exponent m is an adjustable parameter, and does not have fixed value depending on the type of critical point. Excellent agreement with the experimental data has been achieved over the entire investigated spectral range. Obtained relative rms errors equal 0.6% for the real part, and 2.0% for the imaginary part of the index of refraction.
引用
收藏
页码:35 / 42
页数:8
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