Structure and orientation of Al2O3 fibers used in YBa2Cu3Oy sputtering

被引：0

作者：

Blinova, Yu. V. ^{[1
]}

Sudareva, S. V. ^{[1
]}

Kuznetsova, E. I. ^{[1
]}

Krinitsina, T. P. ^{[1
]}

Snigirev, O. V. ^{[2
]}

Porokhov, N. V. ^{[2
]}

机构：

[1] Russian Acad Sci, Inst Met Phys, Ural Branch, Ul S Kovalevskoi 18, Ekaterinburg 620090, Russia

[2] Moscow MV Lomonosov State Univ, Moscow 119991, Russia

来源：

TECHNICAL PHYSICS | 2016年 / 61卷 / 02期

关键词：

Fiber Surface; Electron Diffraction Pattern; Critical Current Density; Stereographic Projection; Sapphire Fiber;

D O I：

10.1134/S1063784216020079

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The internal structure and orientation of thin (150-300 mu m) flexible Al2O3 fibers used as substrates for third-generation high-temperature superconducting wires are studied by different methods. It is shown that using scanning electron microscopy, electron backscatter diffraction, transmission electron microscopy, and X-ray diffraction, one can reliably determine the position of the plane, on which good YBa2Cu3Oy films can be grown.

引用

页码：244 / 249

页数：6

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