Improved testing using failure cost and intensity profiles

被引:1
作者
Ntafos, S
Poceciun-Benson, V
机构
来源
3RD IEEE SYMPOSIUM ON APPLICATION SPECIFIC SYSTEMS AND SOFTWARE ENGINEERING TECHNOLOGY, PROCEEDINGS | 2000年
关键词
D O I
10.1109/ASSET.2000.888068
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The cost of field failures is arguably a very important factor in judging the quality of software. It would be nice if field failure costs could be used before the software is released so as to improve its quality. We introduced the expected cost of field failures [11] as a measure of rest effectiveness and demonstrated that significant benefits ale possible even with rather crude cost and failure rate estimates. In this paper we discuss the main issues that arise in trying to reduce the cost of field failures through better test effort allocation. We introduce improved models and strategies and present analytical and experimental (simulation) evaluations.
引用
收藏
页码:143 / 147
页数:5
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