Complete analysis of a transmission electron diffraction pattern of a MoS2-graphite heterostructure

被引：9

作者：

Adrian, Marlene

Senftleben, Arne ^{[1
]}

Morgenstern, Silvio

Baumert, Thomas

机构：

[1] Univ Kassel, Inst Phys, Heinrich Plett Str 40, D-34132 Kassel, Germany

来源：

ULTRAMICROSCOPY | 2016年 / 166卷

关键词：

Electron diffraction; Moire pattern; Superstructure; Van der Waals heterostructure; GRAPHENE;

D O I：

10.1016/j.ultramic.2016.04.002

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The combination of various 2D layered materials in multilayer heterostructures arises great interest in the current science. Due to the large variety of electronic properties of the group of 2D layered materials the combination opens a new pathway towards ultrasmall electronic devices. In this contribution we present a full mathematical description of multilayer heterostructure samples and their diffraction patterns including a proposal of a consistent assignment of the superstructure diffraction spots. A 27 nm thick MoS2-graphite heterostructure was produced and fully analysed with the methods presented in this paper. (C) 2016 Elsevier B.V. All rights reserved.

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页码：9 / 15

页数：7

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