Application of wavelet digital filter of Fourier Transform Profilometry in 3-D measurement

被引：1

作者：

Wang, YS ^{[1
]}

Fu, S ^{[1
]}

Xu, JQ ^{[1
]}

Zhou, CL ^{[1
]}

Si, SC ^{[1
]}

Gao, CY ^{[1
]}

机构：

[1] Shandong Univ, Sch Phys & Microelect, Jinan 250061, Peoples R China

来源：

ADVANCES IN MATERIALS MANUFACTURING SCIENCE AND TECHNOLOGY | 2004年 / 471-472卷

关键词：

wavelet transform; Fourier transform profilometry; spectrum overlapping;

D O I：

10.4028/www.scientific.net/MSF.471-472.654

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Fourier transform profilometry in 3-D measurement based on wavelet digital filter is presented in this paper. Before phase demodulation, original modulated grating image is handled with wavelet transform in order to remove the background components and high frequency. This method resolves spectrum overlapping at some extent and reduces the requirement of low-pass filter.

引用

页码：654 / 657

页数：4